K-space interpretation of image-scanning-microscopy

نویسندگان

چکیده

In recent years, image-scanning microscopy (ISM, also termed pixel-reassignment microscopy) has emerged as a technique that improves the resolution and signal-to-noise compared to confocal widefield by employing detector array at image plane of laser scanning microscope. Here, we present k-space analysis coherent ISM, showing ISM is equivalent spotlight synthetic-aperture radar (SAR) analogous oblique-illumination microscopy. This insight indicates can be performed with single placed in sample, which numerically demonstrate.

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ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 2023

ISSN: ['1520-8842', '0003-6951', '1077-3118']

DOI: https://doi.org/10.1063/5.0142000